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JEDEC JEP131APROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)standard by JEDEC Solid State Technology Association, 05/01/2005
JEDEC JEP150STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTSstandard by JEDEC Solid State Technology Association, 05/01/2005
JEDEC JESD 48BPRODUCT DISCONTINUANCEstandard by JEDEC Solid State Technology Association, 05/01/2005
JEDEC JESD 82-13ADEFINITION OF THE SSTVN16859 2.5-2.6 V 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR PC1600, PC2100, PC2700 AND PC3200 DDR DIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 05/01/2005
JEDEC JESD8-16ABUS INTERCONNECT LOGIC (BIC) FOR 1.2 Vstandard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD8-17DRIVER SPECIFICATIONS FOR 1.8 V POWER SUPPLY POINT-TO-POINT DRIVERSstandard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JEP149APPLICATION THERMAL DERATING METHODOLOGIESstandard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD82-3BDEFINITION OF THE SSTV16857 2.5 V, 14-BIT SSTL_2 REGISTERED BUFFER FOR DDR DIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD90A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIESstandard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD 22-B110A (R2009)SUBASSEMBLY MECHANICAL SHOCKstandard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD22-B104C (R2009)MECHANICAL SHOCKstandard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD22-A119 (R2009)LOW TEMPERATURE STORAGE LIFEstandard by JEDEC Solid State Technology Association, 11/01/2004