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BS PD CEN ISO/TR 20659‑2:2024
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JEDEC JEP156A
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JEDEC JESD302 (R2009)
JEDEC JESD302 (R2009)RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICEstandard by JEDEC Solid State Technology Association, 01/01/1965
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JEDEC JESD284-A (R2002)
JEDEC JESD284-A (R2002)TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCEstandard by JEDEC Solid State Technology Association, 11/01/1963
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JEDEC JESD 471 (R2009)
JEDEC JESD 471 (R2009)SYMBOL AND LABEL FOR ELECTROSTATIC SENSITIVE DEVICESstandard by JEDEC Solid State Technology Association,
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JEDEC JESD82-32
JEDEC JESD82-32DDR4 DATA BUFFER DEFINITION (DDR4DB01)standard by JEDEC Solid State Technology Association,
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JEDEC JESD46D
JEDEC JESD46DCUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY ELECTRONIC PRODUCT SUPPLIERSstandard by JEDEC Solid State Technology Association,
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JEDEC JESD37A
JEDEC JESD37ALognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Methodstandard by JEDEC Solid State Technology Association, 08/01/2017
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JEDEC JESD30H
JEDEC JESD30HDescriptive Designation System for Semiconductor-device Packagesstandard by JEDEC Solid State Technology Association, 08/01/2017
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JEDEC JESD214.01
JEDEC JESD214.01CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDINGstandard by JEDEC Solid State Technology Association, 08/01/2017
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JEDEC JESD22-A108F
JEDEC JESD22-A108FTEMPERATURE, BIAS, AND OPERATING LIFEstandard by JEDEC Solid State Technology Association, 07/01/2017
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JEDEC JESD47J
JEDEC JESD47JSTRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 08/01/2017
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JEDEC JESD224A
JEDEC JESD224AUniversal Flash Storage (UFS) Teststandard by JEDEC Solid State Technology Association, 07/01/2017
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