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BS PD CEN ISO/TR 20659‑2:2024
BS PD CEN ISO/TR 20659‑2:2024 Rheological test methods. Fundamentals...
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BS PD ISO/IEC TS 18013‑7:2024
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Adjunct-to-E112-Methods-for-Dete Adjunct-to-D2255-Test-Method-for Adjunct-to-D-1250-Petroleum-Meas ISO-IEC-TR-17026-2015-01 ISO-IEC-17007-2009-09 ISO-IEC-TS-17027-2014-02 ISO-IEC-17011-2017-11 ISO-10015-1999-R2005 ISO-14020-2000-R2016 ISO-14015-2001-R2007

JEDEC There are 551 products.

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JEDEC JESD8-19
JEDEC JESD8-19POD18 - 1.8 V Pseudo Open Drain I/Ostandard by JEDEC Solid State Technology Association, 12/01/2006
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JEDEC JESD 82-22
JEDEC JESD 82-22INSTRUMENTATION CHIP DATA SHEET FOR FBDIMM DIAGNOSTIC SENSELINESstandard by JEDEC Solid State Technology Association, 11/01/2006
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$60.63 $141.00 -57% In stock
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JEDEC JESD89A
JEDEC JESD89AMEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 10/01/2006
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JEDEC JESD22-B117A
JEDEC JESD22-B117ASOLDER BALL SHEARstandard by JEDEC Solid State Technology Association, 10/01/2006
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JEDEC JESD 46C
JEDEC JESD 46CCUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERSstandard by JEDEC Solid State Technology Association, 10/01/2006
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$31.82 $74.00 -57% In stock
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JEDEC JESD82-14A
JEDEC JESD82-14ADEFINITION OF THE SSTUB32868 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 10/01/2006
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$32.68 $76.00 -57% In stock
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JEDEC JEP121A
JEDEC JEP121AREQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATIONstandard by JEDEC Solid State Technology Association, 10/01/2006
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JEDEC JEP179
JEDEC JEP179DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATIONstandard by JEDEC Solid State Technology Association, 06/01/2006
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JEDEC JESD8-7A
JEDEC JESD8-7AADDENDUM No. 7 to JESD8 - 1.8 V + -0.15 V (NORMAL RANGE), AND 1.2 V - 1.95 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITstandard by JEDEC Solid State Technology Association, 06/01/2006
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JEDEC JP 002
JEDEC JP 002CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINEstandard by JEDEC Solid State Technology Association, 03/01/2006
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JEDEC JESD202
JEDEC JESD202METHOD FOR CHARACTERIZING THE ELECTROMIGRATION FAILURE TIME DISTRIBUTION OF INTERCONNECTS UNDER CONSTANT-CURRENT AND TEMPERATURE STRESSstandard by JEDEC Solid State Technology Association, 03/01/2006
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JEDEC JESD75-6
JEDEC JESD75-6PSO-N/PQFN PINOUTS STANDARDIZED FOR 14-, 16-, 20-, AND 24-LEAD LOGIC FUNCTIONSstandard by JEDEC Solid State Technology Association, 03/01/2006
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Showing 313 - 324 of 551 items