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NASA GSFC PPL-21...
ESD SP5.4.1-2017For Latch-up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits Transient Latch-up Testing Device Levelstandard by EOS/ESD Association, Inc., 2018
ESD SP27.1-2018For the Recommended Information Flow for Potential EOS Issues between Automotive OEM, Tier 1, and Semiconductor Manufacturersstandard by EOS/ESD Association, Inc., 04/25/2018
ESD STM4.1-2017For the Protection of Electrostatic Discharge Susceptible Items - Worksurface - Resistance Measurements (Including Shelving and Mobile Equipment)standard by EOS/ESD Association, Inc., 2018
ESD STM11.13-2018ESD Association Standard Test Method for the Protection of Electrostatic Discharge Susceptible Items - Two-Point Resistance Measurementstandard by EOS/ESD Association, Inc., 2018
ESD TR22.0-01-14Relevant ESD Foundry Parameters for Seamless ESD Design and Verification Flowstandard by EOS/ESD Association, Inc., 2014ESD Parameter Working Group and Special Interest Group
ESD STM2.1-2018Garments - Resistive Characterizationstandard by EOS/ESD Association, Inc., 2018
ESD SP5.0-2018Reporting ESD Withstand Levels on Datasheetsstandard by EOS/ESD Association, Inc., 2018
ESD SP5.2-2019Machine Model (MM) Component Levelstandard by EOS/ESD Association, Inc., 2019
ESD SP9.2-2019Foot Grounders Resistive Characterization (excluding static control footwear)standard by EOS/ESD Association, Inc., 02/22/2019
ESD JS-002-2018ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) - Device Levelstandard by EOS/ESD Association, Inc., 12/17/2018
ESD SP5.3.3-2018Charged Device Model (CDM) Testing - Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Methodstandard by EOS/ESD Association, Inc., 2018
ESD SP5.6-2019Human Metal Model (HMM) - Component Levelstandard by EOS/ESD Association, Inc., 2019