No products
Viewed products
CFR 42CFR 1-399...
AAMI EC12:2000/(R)2020...
JEDEC JESD68.01COMMON FLASH INTERFACE (CFI)standard by JEDEC Solid State Technology Association, 09/01/2003
JEDEC JEP119AA PROCEDURE FOR EXECUTING SWEATstandard by JEDEC Solid State Technology Association, 08/01/2003
JEDEC JESD91-A (R2011)METHOD FOR DEVELOPING ACCELERATION MODELS FOR ELECTRONIC COMPONENT FAILURE MECHANISMSstandard by JEDEC Solid State Technology Association, 08/01/2003
JEDEC JESD92PROCEDURE FOR CHARACTERIZING TIME-DEPENDENT DIELECTRIC BREAKDOWN OF ULTRA-THIN GATE DIELECTRICSstandard by JEDEC Solid State Technology Association, 08/01/2003
JEDEC JESD22-B111BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTSstandard by JEDEC Solid State Technology Association, 07/01/2003
JEDEC JESD22-B100B (R2016)PHYSICAL DIMENSIONstandard by JEDEC Solid State Technology Association, 06/01/2003
JEDEC JESD82-4BSTANDARD FOR DEFINITION OF THE SSTV16859 2.5 V, 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR STACKED DDR DIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 05/01/2003
JEDEC JEP104C.01REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 05/01/2003
JEDEC JESD 22-B105C (R2006)LEAD INTEGRITYstandard by JEDEC Solid State Technology Association, 05/01/2003
JEDEC JEP145GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEMstandard by JEDEC Solid State Technology Association, 02/01/2003
JEDEC JESD 22-B108ACOPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 01/01/2003
JEDEC JESD100B.01TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS, MICROPROCESSORS, AND MEMORY INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 12/01/2002