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BS PD CEN ISO/TR 20659‑2:2024
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JEDEC JEP133C
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JEDEC JESD 209A-1
JEDEC JESD 209A-1Addendum No. 1 to JESD209A - LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM, 1.2 V I/Ostandard by JEDEC Solid State Technology Association, 03/01/2009
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JEDEC JESD22-A104D
JEDEC JESD22-A104DTEMPERATURE CYCLINGstandard by JEDEC Solid State Technology Association, 03/01/2009
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JEDEC JESD22-A101C
JEDEC JESD22-A101CSTEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TESTstandard by JEDEC Solid State Technology Association, 03/01/2009
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JEDEC JS 9703
JEDEC JS 9703IPC/JEDEC-9703: Mechanical Shock Test Guidelines for Solder Joint Reliabilitystandard by JEDEC Solid State Technology Association, 03/01/2009
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JEDEC JEP 122E
JEDEC JEP 122EFAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 03/01/2009
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JEDEC JESD82-20A
JEDEC JESD82-20AFBDIMM: ADVANCED MEMORY BUFFER (AMB)standard by JEDEC Solid State Technology Association, 03/01/2009
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JEDEC JESD 22-A117B
JEDEC JESD 22-A117BELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TESTstandard by JEDEC Solid State Technology Association, 03/01/2009
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JEDEC JESD 22-A110C
JEDEC JESD 22-A110CHIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)standard by JEDEC Solid State Technology Association, 01/01/2009
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JEDEC JEP146A
JEDEC JEP146AGUIDELINES FOR SUPPLIER PERFORMANCE RATINGstandard by JEDEC Solid State Technology Association, 01/01/2009
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JEDEC JESD22-B109A
JEDEC JESD22-B109AFLIP CHIP TENSILE PULLstandard by JEDEC Solid State Technology Association, 01/01/2009
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JEDEC JESD22-A114F
JEDEC JESD22-A114FELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)standard by JEDEC Solid State Technology Association, 12/01/2008
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JEDEC JEP 148A
JEDEC JEP 148ARELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENTstandard by JEDEC Solid State Technology Association, 12/01/2008
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Showing 229 - 240 of 551 items