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JEDEC JESD8-21POD135 - 1.35 V PSEUDO OPEN DRAIN I/Ostandard by JEDEC Solid State Technology Association, 07/01/2010
JEDEC JESD 79-3EDDR3 SDRAM STANDARDstandard by JEDEC Solid State Technology Association, 07/01/2010
JEDEC JESD 47G.01STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 04/01/2010
JEDEC JESD213STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENTstandard by JEDEC Solid State Technology Association, 03/01/2010
JEDEC JS 001ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) - COMPONENT LEVELstandard by JEDEC Solid State Technology Association, 04/01/2010
JEDEC JESD 35-APROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICSstandard by JEDEC Solid State Technology Association, 03/01/2010
JEDEC JESD 22-A115BELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)standard by JEDEC Solid State Technology Association, 03/01/2010
JEDEC JESD84-A441EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)standard by JEDEC Solid State...
JEDEC JESD 209BLOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARDstandard by JEDEC Solid State Technology Association, 02/01/2010
JEDEC JESD 209-2BLOW POWER DOUBLE DATA RATE 2 (LPDDR2)standard by JEDEC Solid State Technology Association, 02/01/2010
JEDEC JEP133CGUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITSstandard by JEDEC Solid State Technology Association, 01/01/2010
JEDEC JESD22-C101EFIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTSstandard by JEDEC Solid State Technology Association, 12/01/2009