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JEDEC JESD51-14INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW TROUGH A SINGLE PATHstandard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD22-A110DHIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD31DGENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JEP 122FFAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD217TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGESstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD 78CIC LATCH-UP TESTstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD 218SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHODstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD22-B108BCOPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD 219SOLID STATE DRIVE (SSD) ENDURANCE WORKLOADSstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD22-B115ASOLDER BALL PULLstandard by JEDEC Solid State Technology Association, 08/01/2010
JEDEC JEP159PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITYstandard by JEDEC Solid State Technology Association, 08/01/2010
JEDEC JESD79-3-1Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600Amendment by JEDEC Solid State Technology Association, 07/01/2010