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IEC 62878-1-1 (2015-05)
IEC 62878-1-1:2015 Device embedded substrate - Part 1-1: Generic specification - Test methodsMore info
IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.180 : Printed circuits and boards 31.190 : Electronic component assemblies |
| Number of pages | 109 |
| Replace | IEC 91/1248/FDIS (2015-02) |
| Cross references | DIN EN 62878-1-1 (2016-03), IDT |
| Year | 2015 |
| Document history | IEC 62878-1-1 (2015-05) |
| Country | Switzerland |
| Keyword | IEC62878;IEC 62878-1-1:2015 |