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OIML R 126 Errata Evidential breath...
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JEDEC JESD4 (R2002)DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODESstandard by JEDEC Solid State Technology Association, 11/01/1983
JEDEC JESD2DIGITAL BIPOLAR LOGIC PINOUTS FOR CHIP CARRIERSstandard by JEDEC Solid State Technology Association, 12/01/1982
JEDEC JESD 24-7 (R2002)ADDENDUM No. 7 to JESD24 - COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORSAmendment by JEDEC Solid State Technology Association, 08/01/1982
JEDEC JESD 23TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES: standard by JEDEC Solid State Technology Association, 05/01/1982
JEDEC JESD 1LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARSstandard by JEDEC Solid State Technology Association, 04/01/1982
JEDEC JESD 5 (R2002)MEASUREMENT OF TEMPERATURE COEFFICIENT OF VOLTAGE REGULATOR DIODESstandard by JEDEC Solid State Technology Association, 02/01/1982
JEDEC JESD 370B (R2003)DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 02/01/1982
JEDEC JESD 381-A (R2002)METHOD OF DIODE Q MEASUREMENTstandard by JEDEC Solid State Technology Association, 11/01/1981
JEDEC JESD311-A (R2009)MEASUREMENT OF TRANSISTOR NOISE FIGURE AT MF, HF, AND VHFstandard by JEDEC Solid State Technology Association, 11/01/1981
JEDEC JESD419-A (R2001)STANDARD LIST OF VALUES TO BE USED IN SEMICONDUCTOR DEVICE SPECIFICATIONS AND REGISTRATION FORMATstandard by JEDEC Solid State Technology Association, 10/01/1980
JEDEC EIA 397-1ADDENDUM No. 1 TO EIA-397Amendment by JEDEC Solid State Technology Association, 07/01/1980
JEDEC JESD13-BSTANDARD SPECIFICATION FOR DESCRIPTION OF B SERIES CMOS DEVICESstandard by JEDEC Solid State Technology Association, 05/01/1980