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JEDEC JESD 35-2
JEDEC JESD 35-2ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICSstandard by JEDEC Solid State Technology Association, 02/01/1996
$23.22 $54.00 -57%Reduced price!In stockJEDEC JESD54
JEDEC JESD54STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICESstandard by JEDEC Solid State Technology Association, 02/01/1996
$33.54 $78.00 -57%Reduced price!In stockJEDEC JESD51
JEDEC JESD51METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)standard by JEDEC Solid State Technology Association, 12/01/1995
$21.93 $51.00 -57%Reduced price!In stockJEDEC JESD51-1
JEDEC JESD51-1INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)standard by JEDEC Solid State Technology Association, 12/01/1995
$33.54 $78.00 -57%Reduced price!In stockJEDEC JESD38
JEDEC JESD38STANDARD FOR FAILURE ANALYSIS REPORT FORMATstandard by JEDEC Solid State Technology Association, 12/01/1995
$23.22 $54.00 -57%Reduced price!In stockJEDEC JESD52
JEDEC JESD52STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICESstandard by JEDEC Solid State Technology Association, 11/01/1995
$24.08 $56.00 -57%Reduced price!In stockJEDEC JEP123
JEDEC JEP123GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERSstandard by JEDEC Solid State Technology Association, 10/01/1995
$26.66 $62.00 -57%Reduced price!In stockJEDEC JESD 35-1
JEDEC JESD 35-1ADDENDUM No. 1 to JESD35 - GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICSstandard by JEDEC Solid State Technology Association, 09/01/1995
$28.81 $67.00 -57%Reduced price!In stockJEDEC JESD8-6
JEDEC JESD8-6ADDENDUM No. 6 to JESD8 - HIGH SPEED TRANSCEIVER LOGIC (HSTL)- A 1.5 V OUTPUT BUFFER SUPPLY VOLTAGE BASED INTERFACE STANDARD FOR DIGITAL INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 08/01/1995
$25.80 $60.00 -57%Reduced price!In stockJEDEC JESD16-A (R2008)
JEDEC JESD16-A (R2008)ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)standard by JEDEC Solid State Technology Association, 04/01/1995
$33.54 $78.00 -57%Reduced price!In stockJEDEC JESD 24-10 (R2002)
JEDEC JESD 24-10 (R2002)ADDENDUM No. 10 to JESD24 - TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODESAmendment by JEDEC Solid State Technology Association, 08/01/1994
$22.79 $53.00 -57%Reduced price!In stockJEDEC JESD3-C
JEDEC JESD3-CSTANDARD DATA TRANSFER FORMAT BETWEEN DATA PREPARATION SYSTEM AND PROGRAMMABLE LOGIC DEVICE PROGRAMMERstandard by JEDEC Solid State Technology Association, 06/01/1994
$33.54 $78.00 -57%Reduced price!In stock
