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Adjunct-to-E112-Methods-for-Dete Adjunct-to-D2255-Test-Method-for Adjunct-to-D-1250-Petroleum-Meas ISO-IEC-TR-17026-2015-01 ISO-IEC-17007-2009-09 ISO-IEC-TS-17027-2014-02 ISO-IEC-17011-2017-11 ISO-10015-1999-R2005 ISO-14020-2000-R2016 ISO-14015-2001-R2007

JEDEC There are 551 products.

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JEDEC JESD 35-2
JEDEC JESD 35-2ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICSstandard by JEDEC Solid State Technology Association, 02/01/1996
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JEDEC JESD54
JEDEC JESD54STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICESstandard by JEDEC Solid State Technology Association, 02/01/1996
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JEDEC JESD51
JEDEC JESD51METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)standard by JEDEC Solid State Technology Association, 12/01/1995
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JEDEC JESD51-1
JEDEC JESD51-1INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)standard by JEDEC Solid State Technology Association, 12/01/1995
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JEDEC JESD38
JEDEC JESD38STANDARD FOR FAILURE ANALYSIS REPORT FORMATstandard by JEDEC Solid State Technology Association, 12/01/1995
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JEDEC JESD52
JEDEC JESD52STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICESstandard by JEDEC Solid State Technology Association, 11/01/1995
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$26.66 $62.00 -57% In stock
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JEDEC JEP123
JEDEC JEP123GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERSstandard by JEDEC Solid State Technology Association, 10/01/1995
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$28.81 $67.00 -57% In stock
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JEDEC JESD 35-1
JEDEC JESD 35-1ADDENDUM No. 1 to JESD35 - GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICSstandard by JEDEC Solid State Technology Association, 09/01/1995
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JEDEC JESD8-6
JEDEC JESD8-6ADDENDUM No. 6 to JESD8 - HIGH SPEED TRANSCEIVER LOGIC (HSTL)- A 1.5 V OUTPUT BUFFER SUPPLY VOLTAGE BASED INTERFACE STANDARD FOR DIGITAL INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 08/01/1995
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JEDEC JESD16-A (R2008)
JEDEC JESD16-A (R2008)ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)standard by JEDEC Solid State Technology Association, 04/01/1995
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JEDEC JESD 24-10 (R2002)
JEDEC JESD 24-10 (R2002)ADDENDUM No. 10 to JESD24 - TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODESAmendment by JEDEC Solid State Technology Association, 08/01/1994
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JEDEC JESD3-C
JEDEC JESD3-CSTANDARD DATA TRANSFER FORMAT BETWEEN DATA PREPARATION SYSTEM AND PROGRAMMABLE LOGIC DEVICE PROGRAMMERstandard by JEDEC Solid State Technology Association, 06/01/1994
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Showing 457 - 468 of 551 items