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BS PD CEN ISO/TR 20659‑2:2024 Rheological test methods. Fundamentals...

BS PD ISO/IEC TS 18013‑7:2024 Historical[ Withdrawn ] Personal...

BS PD ISO/TS 20790:2024 Oil and gas industries including lower carbon...

BS PD CEN ISO/TR 8124‑8:2024 Safety of toys - Age determination. First...

BS PD ISO/IEC TS 8236-2:2025 Information technology. Provisioning,...

BS PD CEN/TR 14380:2024 Lighting applications. Tunnel lighting standard...


BS PD CEN/TR 16389:2025 Automotive fuels. Paraffinic diesel fuel and...
JEDEC JESD51-32THERMAL TEST BOARD STANDARDS TO ACCOMMODATE MULTI-CHIP PACKAGESstandard by JEDEC Solid State Technology Association, 12/01/2010
JEDEC JEP709A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD22-A115CELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD22-A111AEVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICESstandard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD22-A108DTEMPERATURE, BIAS, AND OPERATING LIFEstandard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD22-A102DACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVEstandard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD51-14INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW TROUGH A SINGLE PATHstandard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JEP 122FFAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD22-A110DHIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD31DGENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD217TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGESstandard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD 78CIC LATCH-UP TESTstandard by JEDEC Solid State Technology Association, 09/01/2010