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BS PD CEN ISO/TR 20659‑2:2024
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BS PD ISO/IEC TS 18013‑7:2024
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BS ISO/IEC 29151:2017
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IEC There are 13303 products.
IEC 60749-31 Ed. 1.0 b CORR1:2003
IEC 60749-31 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)Corrigenda by International Electrotechnical Commission, 08/13/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-22 Ed. 1.0 b CORR1:2003
IEC 60749-22 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strengthCorrigenda by International Electrotechnical Commission, 08/13/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-20 Ed. 1.0 b CORR1:2003
IEC 60749-20 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heatCorrigenda by International Electrotechnical Commission, 08/13/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-13 Ed. 1.0 b CORR1:2003
IEC 60749-13 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphereCorrigenda by International Electrotechnical Commission, 08/13/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-12 Ed. 1.0 b CORR1:2003
IEC 60749-12 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequencyCorrigenda by International Electrotechnical Commission, 08/13/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-2 Ed. 1.0 b CORR1:2003
IEC 60749-2 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressureCorrigenda by International Electrotechnical Commission, 08/12/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-1 Ed. 1.0 b CORR1:2003
IEC 60749-1 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: GeneralCorrigenda by International Electrotechnical Commission, 08/12/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 62035 Ed. 1.1 b:2003
IEC 62035 Ed. 1.1 b:2003 [ Withdrawn ]Discharge lamps (excluding fluorescent lamps) - Safety specifications CONSOLIDATED EDITIONstandard by International Electrotechnical Commission, 08/12/2003
$145.77 $339.00 -57%Reduced price!In stockIEC 60749-9 Ed. 1.0 b CORR1:2003
IEC 60749-9 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of markingCorrigenda by International Electrotechnical Commission, 08/12/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-8 Ed. 1.0 b CORR2:2003
IEC 60749-8 Ed. 1.0 b CORR2:2003Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: SealingCorrigenda by International Electrotechnical Commission, 08/12/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-4 Ed. 1.0 b CORR1:2003
IEC 60749-4 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)Corrigenda by International Electrotechnical Commission, 08/12/2003
$5.11 $11.88 -57%Reduced price!In stockIEC 60749-6 Ed. 1.0 b CORR1:2003
IEC 60749-6 Ed. 1.0 b CORR1:2003Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperatureCorrigenda by International Electrotechnical Commission, 08/12/2003
$5.11 $11.88 -57%Reduced price!In stock
