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IEC 60749-20 Ed. 1.0 b CORR1:2003
M00000725
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IEC 60749-20 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
Corrigenda by International Electrotechnical Commission, 08/13/2003
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