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EIA JESD 82-4B:2003 Definition of the...
BS PD CLC/TS 50134-9:2018...
EIA JESD 38:1995 Standard for Failure Analysis Report Format
EIA JESD 51:1995 Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
EIA JESD 52:1995 Description of Low Voltage TTL-Compatible CMOS Logic Devices
EIA JESD 51-1:1995 Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
EIA TEP 105-18:1995 Color Field Uniformity Test Procedures
EIA TSB 38:1994 (R2002) Test Procedure for Evaluation of 2-Wire 4-Kilohertz Voiceband Duplex Modems
EIA-540DAAA-A:1994 Detail Specification for Dual In-Line Two-Piece Contact Socket for Use in Electronic Equipment
EIA TSB 62-1:1994 (R2002) ITM-1 Characteristics of Large Flaws in Optical Fibers by Dynamic Tensile Testing with Censoring
EIA-540DBAA:1994 Detail Specification for Decoupling Capacitor Dual In-Line Package Sockets for Use in Electronic Equipment
EIA/TIA-455-31-C:1994 (R2013) FOTP-31 Proof Testing Optical Fibers by Tension
EIA-448-24:1994 Test Method 24 Solid State Switch Transfer Tests