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50001:2011 to 2018 Transition EnMS...
EIA/TIA-423-B:1996 (R2012) Electrical Characteristics of Unbalanced Voltage Digital Interface Circuits
EIA JEP 126:1996 Guideline for Developing and Documenting Package Electrical Models Derived from Computational Analysis
EIA JEP 128:1996 Guide for Standard Probe Pad Sizes and Layouts for Wafer-Level Electrical Testing
EIA JESD 8-8:1996 Stub Series Terminated Logic for 3.3 Volts (SSTL-3)
EIA JESD 51-3:1996 Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
EIA JESD 54:1996 Standard for Description of 54/74ABTXXX and 74BCXXX TTL-Compatibility BiCMOS Logic Devices
EIA JESD 55:1996 Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices
EIA JESD 57:1996 Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
EIA-700AAAB:1996 Detail Specification for 1.0 mm, Two-Part Connectors for Use with Parallel Printed Boards
EIA/IS-692:1996 Ceramic Capacitor Qualification Specification
EIA-700A0AB:1995 Detail Specification for 1.27 mm Pitch, 68 Circuit Memory Card Interconnect System