No products
Viewed products
-
IEC 60947-4-2 Ed. 2.1...
IEC 60947-4-2 Ed. 2.1 b:2002...
-
ADS RS538
ADS RS538...
IEC There are 11508 products.
IEC 60936-3 Ed. 1.0 en:2002
IEC 60936-3 Ed. 1.0 en:2002 [ Withdrawn ]Maritime navigation and radiocommunication equipment and systems - Radar - Part 3: Radar with chart facilities - Performance requirements - Methods of testing and required test resultsstandard by International Electrotechnical Commission, 04/29/2002
$35.26 $82.00 -57%Reduced price!In stockIEC 60749-11 Ed. 1.0 b:2002
IEC 60749-11 Ed. 1.0 b:2002Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath methodstandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 61577-3 Ed. 1.0 b:2002
IEC 61577-3 Ed. 1.0 b:2002 [ Withdrawn ]Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 3: Specific requirements for radon decay product measuring instrumentsstandard by International Electrotechnical Commission, 04/12/2002
$62.78 $146.00 -57%Reduced price!In stockIEC 60749-9 Ed. 1.0 b:2002
IEC 60749-9 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of markingstandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60749-6 Ed. 1.0 b:2002
IEC 60749-6 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperaturestandard by International Electrotechnical Commission, 04/12/2002
$5.16 $12.00 -57%Reduced price!In stockIEC 60749-4 Ed. 1.0 b:2002
IEC 60749-4 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)standard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60749-2 Ed. 1.0 b:2002
IEC 60749-2 Ed. 1.0 b:2002Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressurestandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60749-13 Ed. 1.0 b:2002
IEC 60749-13 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmospherestandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60870-6-503 Ed. 2.0 en:2002
IEC 60870-6-503 Ed. 2.0 en:2002 [ Withdrawn ]Telecontrol equipment and systems - Part 6-503: Telecontrol protocols compatible with ISO standards and ITU-T recommendations - TASE.2 Services and protocolstandard by International Electrotechnical...
$166.41 $387.00 -57%Reduced price!In stockIEC 60034-12 Ed. 2.0 b:2002
IEC 60034-12 Ed. 2.0 b:2002 [ Withdrawn ]Rotating electrical machines - Part 12: Starting performance of single-speed three-phase cage induction motorsstandard by International Electrotechnical Commission, 04/09/2002
$19.35 $45.00 -57%Reduced price!In stockIEC 60870-6-802 Ed. 2.0 en:2002
IEC 60870-6-802 Ed. 2.0 en:2002 [ Withdrawn ]Telecontrol equipment and systems - Part 6-802: Telecontrol protocols compatible with ISO standards and ITU-T recommendations - TASE.2 Object modelsstandard by International Electrotechnical...
$80.41 $187.00 -57%Reduced price!In stockIEC 60749-7 Ed. 1.0 b:2002
IEC 60749-7 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gasesstandard by International Electrotechnical Commission, 04/09/2002
$18.06 $42.00 -57%Reduced price!In stock
