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IEC 60749-4 Ed. 1.0 b:2002
M00001883
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IEC 60749-4 Ed. 1.0 b:2002 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
standard by International Electrotechnical Commission, 04/12/2002
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