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JEDEC JEB 15

M00002127

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JEDEC JEB 15 TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS

standard by JEDEC Solid State Technology Association, 11/01/1969

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This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.