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New Reduced price! JEDEC JESD 435 (R2009)

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JEDEC JESD 435 (R2009)

Reference: M00002115

Condition: New product

JEDEC JESD 435 (R2009) STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

standard by JEDEC Solid State Technology Association, 04/01/1976

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Full Description

This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

Published: 04/01/1976 Number of Pages: 23File Size: 1 file , 620 KB