Cart 0 Product Products (empty)
No products
To be determined Shipping
$0.00 Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart. There is 1 item in your cart.
Total products
Total shipping To be determined
Total
New Reduced price! 
View larger
View larger 
IEC 60749-27 Amd.1 Ed. 2.0 b:2012
M00000637
New product
IEC 60749-27 Amd.1 Ed. 2.0 b:2012 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Amendment by International Electrotechnical Commission, 09/25/2012
In stock