Cart 0 Product Products (empty)

No products

To be determined Shipping

$0.00 Total

Product successfully added to your shopping cart

Quantity

Total

There are 0 items in your cart. There is 1 item in your cart.

Total products

Total shipping To be determined

Total

Continue shopping Proceed to checkout

New Reduced price! IEC 62415 Ed. 1.0 b:2010

View larger

IEC 62415 Ed. 1.0 b:2010

Reference: M00000819

Condition: New product

IEC 62415 Ed. 1.0 b:2010 Semiconductor devices - Constant current electromigration test

standard by International Electrotechnical Commission, 05/19/2010

In stock

Full Description

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Edition: 1.0 Published: 05/19/2010 Number of Pages: 22 File Size: 1 file , 910 KB