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New Reduced price! IEC 60749-17 Ed. 1.0 b:2003 View larger

IEC 60749-17 Ed. 1.0 b:2003

M00000976

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IEC 60749-17 Ed. 1.0 b:2003 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

standard by International Electrotechnical Commission, 02/20/2003

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Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.