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New Reduced price! IEC 60444-2 Ed. 1.0 b:1980

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IEC 60444-2 Ed. 1.0 b:1980

Reference: M00001270

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IEC 60444-2 Ed. 1.0 b:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

standard by International Electrotechnical Commission, 01/01/1980

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Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

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Edition: 1.0 Published: 01/01/1980 Number of Pages: 18 File Size: 1 file , 540 KB