Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.
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Edition: 1.0 Published: 01/01/1985 Number of Pages: 35 File Size: 1 file , 1.3 MB