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This Japanese Industrial Standard specifies the measuring methods electrical performances of bipolar transistors and field-effect transistors (hereafter referred to only 'transistors' when they are not classified) mainly used in electronic equipment.
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2014-10-20 |
| ICS | 31.080.30 : Transistors |
| Number of pages | 81 |
| Cross references | IEC 60747-7 (1988), NEQ |
| Year | 1990 |
| Document history | |
| Country | Japan |
| Keyword | JIS 7030;7030;JIS C 7030-1993 |