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1.1 This test method covers determination of ductility utilizing Epstein test strips and a bending device for bending the strip over a predetermined radius. It is intended for commercial silicon-bearing steel sheet or strip of nonoriented types in the thickness range from 0.010 to 0.031 in. [0.25 to 0.79 mm], inclusive.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| Confirmation date | 2016-04-01 |
| ICS | 77.140.50 : Flat steel products and semi-products |
| Number of pages | 2 |
| Replace | ASTM A720/A720M-02(2011) |
| Set | ASTMVOL0307 |
| Year | 2002 |
| Document history | ASTM A720/A720M-02(2011) |
| Country | USA |
| Keyword | ASTM 720;ASTM A720;ASTM A720;10.1520/A0720_A0720M-02R16E01 |