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ASTM F1845-08(2016)
Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass SpectrometerMore info
1.1 This test method determines the concentrations of trace metallic impurities in high purity (99.99 wt. % pure, or purer, with respect to metallic trace impurities) aluminum-copper, aluminum-silicon and aluminum-copper-silicon alloys with major alloy constituents as follows:
| aluminum | Greater than 95.0 % |
| copper | Less or equal than 5.0 % |
| silicon | Less or equal than 5.0 % |
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| Confirmation date | 2016-05-01 |
| ICS | 29.050 : Superconductivity and conducting materials |
| Number of pages | 5 |
| Replace | ASTM F1845-08 |
| Set | ASTMVOL1004 |
| Year | 2008 |
| Document history | ASTM F1845-08 |
| Country | USA |
| Keyword | ASTM 1845;ASTM F1845;ASTM F1845;10.1520/F1845-08R16 |