Cart 0 Product Products (empty)
No products
To be determined Shipping
$0.00 Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart. There is 1 item in your cart.
Total products
Total shipping To be determined
Total
New Sale! 
View larger
View larger ASTM F76-08(2016)e1
New product
ASTM F76-08(2016)e1
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal SemiconductorsMore info
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens. These test methods differ most substantially in their test specimen requirements.
1.1.1 Test Method A, van der Pauw (1) 2—This test method requires a singly connected test specimen (without any isolated holes), homogeneous in thickness, but of arbitrary shape. The contacts must be sufficiently small and located at the periphery of the specimen. The measurement is most easily interpreted for an isotropic semiconductor whose conduction is dominated by a single type of carrier.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| Confirmation date | 2016-05-01 |
| ICS | 29.045 : Semiconducting materials |
| Number of pages | 14 |
| Replace | ASTM F76-08(2016) |
| Set | ASTMVOL1004 |
| Year | 2008 |
| Document history | ASTM F76-08(2016) |
| Country | USA |
| Keyword | ASTM 76;ASTM F76;ASTM F76;10.1520/F0076-08R16E01 |