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1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (±33 % of the average of two runs) should be expected for replicate counts on the same sample.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| Confirmation date | 2015-10-01 |
| ICS | 17.040.20 : Properties of surfaces |
| Number of pages | 4 |
| Replace | ASTM F24-09 |
| Set | ASTMVOL1503 |
| Year | 2009 |
| Document history | ASTM F24-09 |
| Country | USA |
| Keyword | ASTM 24;ASTM F24;ASTM F24;10.1520/F0024-09R15 |