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ASTM F1262M-14
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)More info
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s.
1.1.1 Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 6 |
| Replace | ASTM F1262M-95(2008) |
| Set | ASTMVOL1004 |
| Year | 2014 |
| Document history | ASTM F1262M-95(2008) |
| Country | USA |
| Keyword | ASTM 1262;ASTM F1262;ASTM F1262;10.1520/F1262M-14 |