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1.1 This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material microstructures. Many materials engineering decisions may be based on qualitative and quantitative analyses of a microstructure. It is essential that microscope magnifications and reticle dimensions be accurate.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 37.020 : Optical equipment |
| Number of pages | 7 |
| Replace | ASTM E1951-02(2007) |
| Set | ASTMVOL0301 |
| Year | 2014 |
| Document history | ASTM E1951-02(2007) |
| Country | USA |
| Keyword | ASTM 1951;ASTM E1951;ASTM E1951;10.1520/E1951-14 |