No products
View larger New product
1.1 This guide acquaints the X-ray photoelectron spectroscopy (XPS) user with the various charge control and charge shift referencing techniques that are and have been used in the acquisition and interpretation of XPS data from surfaces of insulating specimens and provides information needed for reporting the methods used to customers or in the literature.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 71.040.50 : Physicochemical methods of analysis |
| Number of pages | 7 |
| Replace | ASTM E1523-09 + Redline |
| Set | ASTMVOL0306 |
| Year | 2015 |
| Document history | ASTM E1523-09 + Redline |
| Country | USA |
| Keyword | ASTM 1523;ASTM E1523;ASTM E1523;10.1520/E1523-15 |