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ASTM E1250-15
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic DevicesMore info
1.1 Low energy components in the photon energy spectrum of Co-60 irradiators lead to absorbed dose enhancement effects in the radiation-hardness testing of silicon electronic devices. These low energy components may lead to errors in determining the absorbed dose in a specific device under test. This method covers procedures for the use of a specialized ionization chamber to determine a figure of merit for the relative importance of such effects. It also gives the design and instructions for assembling this chamber.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 31.020 : Electronic components in general |
| Number of pages | 10 |
| Replace | ASTM E1250-10 |
| Set | ASTMVOL1202 |
| Year | 2015 |
| Document history | ASTM E1250-10 |
| Country | USA |
| Keyword | ASTM 1250;ASTM E1250;ASTM E1250;10.1520/E1250-15 |