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ASTM E1249-15
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 SourcesMore info
1.1 This practice covers recommended procedures for the use of dosimeters, such as thermoluminescent dosimeters (TLD's), to determine the absorbed dose in a region of interest within an electronic device irradiated using a Co-60 source. Co-60 sources are commonly used for the absorbed dose testing of silicon electronic devices.
Note 1: This absorbed-dose testing is sometimes called “total dose testing” to distinguish it from “dose rate testing.”
Note 2: The effects of ionizing radiation on some types of electronic devices may depend on both the absorbed dose and the absorbed dose rate; that is, the effects may be different if the device is irradiated to the same absorbed-dose level at different absorbed-dose rates. Absorbed-dose rate effects are not covered in this practice but should be considered in radiation hardness testing.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 17.240 : Radiation measurements |
| Number of pages | 17 |
| Replace | ASTM E1249-10 |
| Set | ASTMVOL1202 |
| Year | 2015 |
| Document history | ASTM E1249-10 |
| Country | USA |
| Keyword | ASTM 1249;ASTM E1249;ASTM E1249;10.1520/E1249-15 |