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1.1 This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES).
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 17.180.30 : Optical measuring instruments |
| Number of pages | 5 |
| Replace | ASTM E983-10(2018) + Redline |
| Year | 2019 |
| Document history | ASTM E983-10(2018) + Redline ASTM E983-10 + Redline ASTM E983-05 + Redline ASTM E983-94(1999) + Redline |
| Country | USA |
| Keyword | ASTM 983;ASTM E983;ASTM E983;10.1520/E0983-19 |