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Recommends methods for measuring particles in the range 2 nm to 1 mm using light, scanning electron and transmission electron microscopes. Calculation examples are included.
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| Confirmation date | 2017-11-01 |
| EAN ISBN | 0 580 21076 6 |
| ICS | 19.120 : Particle size analysis. Sieving |
| Number of pages | 40 |
| Replace | BS 3406-4:1963 |
| Year | 1990 |
| Country | United Kingdom |
| Keyword | BS 3406:Part 4:1993 |