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BS EN 62880-1. Semiconductor devices. Wafer level reliability for semiconductor Copper stress migration test method partTitleEN sectionTitleENMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Draft |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general 31.080.99 : Other semiconductor devices |
| Number of pages | 33 |
| Cross references | IEC Document 47/2191/CD |
| Year | 2014 |
| Country | United Kingdom |