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BS ISO 16413:2013
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reportingMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 73016 0 |
| ICS | 35.240.70 : IT applications in science 71.040.40 : Chemical analysis |
| Number of pages | 42 |
| Cross references | ISO 16413:2013 |
| Set | MYSTD-20STD |
| Year | 2013 |
| Country | United Kingdom |
| Keyword | BS ISO 16413 ; BSISO16413 ; BSISO 16413 ; BS ISO16413 |