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BS ISO 17470:2014
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometryMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 84121 7 |
| ICS | 71.040.99 : Other standards related to analytical chemistry |
| Number of pages | 22 |
| Replace | BS ISO 17470:2004 |
| Cross references | ISO 17470:2014 |
| Set | MYSTD-20STD |
| Year | 2014 |
| Country | United Kingdom |
| Keyword | BS ISO 17470 ; BSISO17470 ; BSISO 17470 ; BS ISO17470 |