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BS ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thicknessMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 51949 9 |
| ICS | 71.040.40 : Chemical analysis |
| Number of pages | 26 |
| Replace | BS ISO 14701:2011 |
| Cross references | ISO 14701:2018 IDT |
| Set | MYSTD-20STD |
| Year | 2018 |
| Country | United Kingdom |