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BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopyMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 86519 0 |
| ICS | 71.040.40 : Chemical analysis |
| Number of pages | 34 |
| Cross references | ISO 19830:2015 |
| Set | MYSTD-20STD |
| Year | 2015 |
| Country | United Kingdom |
| Keyword | BS ISO 19830 ; BSISO19830 ; BSISO 19830 ; BS ISO19830 |