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BS ISO 16700:2016
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnificationMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 89052 9 |
| ICS | 37.020 : Optical equipment |
| Number of pages | 30 |
| Replace | BS ISO 16700:2004 |
| Cross references | ISO 16700:2016 |
| Set | MYSTD-20STD |
| Year | 2016 |
| Country | United Kingdom |
| Keyword | BS ISO 16700 ; BSISO16700 ; BSISO 16700 ; BS ISO16700 |