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BS ISO 20263:2017
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materialsMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 89345 2 |
| ICS | 37.020 : Optical equipment 71.040.50 : Physicochemical methods of analysis |
| Number of pages | 54 |
| Cross references | ISO 20263:2017 |
| Set | MYSTD-20STD |
| Year | 2018 |
| Country | United Kingdom |