Cart 0 Product Products (empty)
No products
To be determined Shipping
$0.00 Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart. There is 1 item in your cart.
Total products
Total shipping To be determined
Total
New Sale! 
View larger
View larger ISO 6342:2003 (R2015)
New product
ISO 6342:2003 (R2015)
Micrographics — Aperture cards — Method of measuring thickness of buildup areaMore info
| Author | ISO/TC 171 Document management applications |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Confirmation date | 2015-05-12 |
| Edition | 2 |
| ICS | 37.080 : Document imaging applications |
| Number of pages | 3 |
| Replace | ISO 6342:1993 |
| Weight(kg.) | 0.1051 |
| Year | 2003 |
| Country | Switzerland |