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ISO 17901-2:2015
Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristicsMore info
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
| Author | ISO/TC 172/SC 9 Laser and electro-optical systems |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Edition | 1 |
| ICS | 31.020 : Electronic components in general |
| Number of pages | 20 |
| Weight(kg.) | 0.1340 |
| Year | 2015 |
| Country | Switzerland |