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ISO 15470:2017
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parametersMore info
ISO 15470:2017 describes the way in which specific aspects of the performance of an X-ray photoelectron spectrometer are described.
| Author | ISO/TC 201/SC 7 Electron spectroscopies |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Edition | 2 |
| ICS | 71.040.40 : Chemical analysis |
| Number of pages | 5 |
| Replace | ISO 15470:2004 |
| Weight(kg.) | 0.1085 |
| Year | 2017 |
| Country | Switzerland |