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ISO 25178-72:2017 defines the XML file format x3p for storage and exchange of topography and profile data.
| Author | ISO/TC 213 Dimensional and geometrical product specifications and verification |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Edition | 1 |
| ICS | 17.040.20 : Properties of surfaces |
| Number of pages | 23 |
| Modified by | ISO 25178-72:2017/DAmd 1 |
| Weight(kg.) | 0.1391 |
| Year | 2017 |
| Country | Switzerland |