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ISO 20903:2019
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting resultsMore info
This document specifies the necessary information required in a report of analytical results based on measurements of the intensities of peaks in Auger electron and X-ray photoelectron spectra. Information on methods for the measurement of peak intensities and on uncertainties of derived peak areas is also provided.
| Author | ISO/TC 201/SC 7 Electron spectroscopies |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Edition | 3 |
| ICS | 71.040.40 : Chemical analysis |
| Number of pages | 17 |
| Replace | ISO 20903:2011 |
| Weight(kg.) | 0.1289 |
| Year | 2019 |
| Country | Switzerland |