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This document specifies the test method for the determination of the deviation from a flat image surface, i.e. the sagittal and tangential field curvature of telescopic systems and observational telescopic instruments.
| Author | ISO/TC 172/SC 4 Telescopic systems |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Edition | 1 |
| Number of pages | 5 |
| Weight(kg.) | 0.1085 |
| Year | 2019 |
| Country | Switzerland |